In order to fill the gap of little knowledge about their details, the density of states distributions (DOS) in the upper half of the band gap were determined for a series of wellcharacterised amorphous hydrogenated silicon carbide samples with Tauc gaps between 1.78 and 1.94 eV. A DOS spectroscopic technique, based on the Fourier transform of time-sampled transient photocurrents, allowed the DOS determination on an absolute scale for a wide energy range. The DOS increases in the band tail region with carbon content. It exhibits a minimum at about 0.5 eV which is followed by a defect structure at deeper energies, the density of which also increases with C-content. We find a decreasing time-dependent drift mobility for larger C-content consistent with the lower transit time-determined drift mobility in time-of-flight.